Bias-variance trade-offs analysis using uniform CR bound for images
We apply a uniform Cramer-Rao (CR) bound to study the bias-variance trade-offs in parameter estimation. The uniform CR bound is used to specify achievable and unachievable regions in the bias-variance trade-off plane. The applications considered are: (1) two-dimensional single photon emission computed tomography (SPECT) system, and (2) one dimensional edge localization.<<ETX>>