A self-testing systolic module for VLSI DSP applications
The authors propose a novel concurrent error-detection scheme for error detection in VLSI arrays. The proposed scheme is called LOED (logarithm-based online error detection) and is based on the use of logarithmic coding. This scheme is analyzed and its implementation details are described. Fault coverage and hardware overhead of the scheme are also discussed. The application of LOED to the convolution problem is described, and the advantages of LOED are enumerated.<<ETX>>