Investigation of Passivation Layer of CdZnTe Detector
The process of surface passivation of CdZnTe(CZT) plays dominant role in detector performance, which can decrease the noise of the detector and improve the spectral energy resolution. The thickness of the passivation film has been measured by infrared spectroscopic ellipsometry in this paper. The relationship between thickness of the passivation films and the passivation time was obtained. The results show that the thickness of three samples passivated for 5 min, 10 min, 15 min are 15.669 nm, 17.288 nm and 24.434 nm, respectively