Monte Carlo comparison of the noise performance of InAlAs/InGaAs Double-Gate and Standard HEMTs
A comparison of the noise behavior of Double-Gate and Standard High Electron Mobility Transistors is established by means of Monte Carlo simulations. The intrinsic noise P, R, and C parameters are only moderately improved in the DG-device, but the extrinsic minimum noise figure NFmin reveals a significantly better extrinsic noise performance, more noticeable for higher frequencies due to the better dynamic performance of the DG-device.