Capacitance extraction of on-chip circular stacked inductors
In this paper, we proposed a method to characterize the capacitive coupling effects in circular stacked inductors, which takes the non-overlapping between upper and bottom traces of different layers into account. Compared with the full-wave method and the analytical method with completely overlapping assumption, our method can predict self-resonant frequency (f/sub SR/) for on-chip circular stacked inductors used in RFICs more accurately.