Electrical characterization of VLSI packages
The authors define, verify, and demonstrate measurement instruments and test fixtures required to successfully characterize IC packages electrically for low-frequency applications (<50 MHz). Three fundamentally different measurement techniques were evaluated. One uses the HP 4191A RF Impedance Analyzer instrument, which measures the frequency-domain reflection coefficient and phase angle of any load and calculates its impedance. Another measurement technique uses the HP 4194A Impedance/Gain Phase Analyzer, which measures the frequency-domain voltage across the test load generated by the current through its magnitude and phase shift. The other measurement technique is called ramp-derivative; its measurement principle is based on the time domain transient response and the fundamental definition of resistance, inductance, and capacitance to determine their respective values.<<ETX>>