A novel circuit for the evaluation of thermal impedance characteristics of MOS integrated circuits
The MOS thermal impedance test circuit (MOST) is a simple device for evaluating thermal impedance values using the electrical test method. Results are presented for bipolar. CMOS, and NMOS devices. The data presented show that the use of the MOST circuit is a viable method for procuring average thermal impedance values. It provides a low-cost alternative to integrated systems and can be duplicated for multiple test setups. In a large-scale test area, many of the circuits can be used for simultaneous testing, dedicating one (or more) circuit to each family of devices to be evaluated. In the manner, the measurement delay need only be set once for the initial lot and checked periodically for utmost accuracy.<<ETX>>