Shape from interference patterns
A unique imaging modality based on equal thickness contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. These ETCs are generated as a result of interference between transmitted and diffracted beams. We present a computational framework for representing each view of an object in terms of its object thickness, and then integrating these representations into a 3D surface by algebraic reconstruction. In this framework, the object thickness is first derived from ideal contours and then extended to real data. For real data, the object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features, as well as neighborhood continuity. We apply our approach to images of a sub-micron crystal structure obtained through a graphic process.