An introduction to computer algorithms designed to facilitate I/sub DDT/ current testing of CMOS circuits
This work presents an overview of a new computer algorithm and a computer aided design (CAD) tool. Both of these prove to be useful for dynamic power supply current test methods. In the growing field of iDDT testing many analysis tools that have existed for decades can be used effectively to provide various its levels of results. However, new fields of study often require new tools. This work presents an introduction to the "Toggle" algorithm and the "Mapper" CAD tool. These tools can be used to advance the study and practice of iDDT testing as well as other testing methods