A 2-D spectral analysis method to estimate the modulation parameters in structured illumination microscopy
Structured illumination microscopy is a recent imaging technique that aims at going beyond the classical optical resolution limits by reconstructing a high-resolution image from several low-resolution images acquired through modulation of the transfer function of the microscope. A precise knowledge of the sinusoidal modulation parameters is necessary to enable the super-resolution effect expected after reconstruction. In this work, we investigate the retrieval of these parameters directly from the acquired data, using a novel 2D spectral estimation method.