A Digital Offset Self-Calibration Technique for 3-Bit Flash Converter of an Ultra High-Speed Folding and Interpolating ADC
This paper proposed a digital offset self-calibration technique for the flash converter of an ultra high-speed folding and interpolating ADC. The chip is processed in 0.18-µm CMOS technology. The measured results show that the digital calibration technique can efficiently improve the ADC characteristics.