On-wafer W-band determination of the driving point impedance of a double slot antenna
Part of the ESTEC funded Integrated Antenna Development project includes the development of an optimised 500 GHz planar antenna on a dielectric lens. One aspect of this study involves the development of an accurate model for the antenna impedance at the point where a bolometric detector is inserted in the receiver. To verify the modelling, an on-wafer measurement strategy to determine the driving point impedance of a 100 GHz scale model of the antenna structure was developed. This paper describes the W-band on-wafer measurement technique and compares the experimentally and theoretically derived feed point impedances of the antenna structures.