Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light
Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light from LEDs under test and to increase the dynamic range greatly. The results are in good agreement with those directly tested by a microthermocouple. To avoid extra carrier absorption and modulation effect, the incident exciting light should harbor smaller bandgap than that of LEDs under test.