Oxidized layer of CdZnTe studied by C-V characteristics
In this paper, the CZT oxidized layers on cadmium zinc telluride (CZT) wafer formed by two-step chemical passivation process (KOH-KCl + NH4F/H2O2) were investigated by using XRD, ED-XRF, SEM. The results show that the oxidized layer obtained by using this process has a very uniform and compact morphology and consists mainly of TeO2, TeO3 and CdTeO3. In particular, the thickness of the oxidized layer on the CZT was obtained by using C-V measurements for the first time. The dependence of the thickness of the oxidized layer on the passivation time was obtained and the main factors influencing the results of the C-V measurements were also discussed.